Measuring range

F400 :0~400μm N400:0~400μm F1:0~1250μm F1/90:0~1250μm

N1:0~1250μm F10:0~10000μm CN02:10~200μm

Measuring accuracy

F400, N400 1 point calibration:±(2%+0.７)2 point calibration:±(1%+７)F1, F1/90, N1, CN02 1 point calibration:±(2%+1)2 point calibration:±(1%+1)F10 1 point calibration:±(2%+10) 2 point calibration:±(1%+10)

Calibration

1 point calibration /2 point calibration /basic calibration

Display resolution

0.1um (0~99.9um) / 1um (Over 100um)

Weight

250g(including battery package )

Operation environment

Temperature: 0℃~50℃ humidity: 20%RH～90%RH

Operation mode

Direct testing mode and block statistics mode

Measuring mode

continuous/single

Shutdown mode

manual/automatic

Operation alarm

Ring music to alarm mistake

Signal Dealing

Threshold

Limits setting and automatically alarm measured values out of limit

Data analysis

Analyzing a batch of measuring values via histogram

Statistic function

Mean/ Standard deviation / Number of measurements/ Maximum/ Minimum

Data Merory

Thickness values

500 measuring data

Delete

Single doubtful data / All data of one group

Input/Output

Print

measured values, statistic values, limit values and histogram

Communication

RS232/USB

Power supply

Battery

9V Nickel-hydride/alkaline batteries

Power battery inspection

low voltage indication

Standard delivery

Main unit

1

Integrated probe ((N1orF1)

1

Calibration foil set

4

Calibration base set

1

9V alkaline battery

1

Instruction manual

1

Printer RD-E32-SN

1

Software CTG Insight

1

Optional accessories

probe

F400 F1 F1/90° F10 N400 N1 CN02

Probe model

F400

F1

F1/90°

F10

N400

N1

CN02

Working principle

magnetic induction

induced eddy current

Measuring range(mm)

0～400

0～1250

0～10000

0～400

0～1250

10～200

( chromeplating upon copper base set 0～40)

Resolution (mm)

0.1

0.1

10

0.1

0.1

1

Tolerance

1point calibration (mm)

±(3%H+0.7)

±(3%H+1)

±(3%H+10)

±(3%H+0.7)

±(3%H+1.5)

±(3%H+1)

2point calibration (mm)

±(1%H+0.7)

±((1%H+1)

±(1%H+10)

±(1%H+0.7)

±(1%H+1.5)

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Measuring condition

Min curvature radius (mm)

convex

1

1.5

flat

10

convex

1.5

3

flat

Only flat

Min

measure area(mm)

F3

F7

F7

F4

F4

F5

F5

F7

Critical substrate thickness(mm)

0.2

0.5

0.5

2

0.3

0.3

0.3

No limit